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Our
support can range
from simple elemental identification, to complete investigation of
the contamination source and implementation of a corrective action
strategy. |
Contamination
is a problem common
to many industries and products. Using Scanning Electron Microscopy
(SEM) with Energy Dispersive Spectroscopy (EDS), Micro Fourier Transform
Infrared Spectroscopy (Micro-FTIR) and Gas Chromatography - Mass Spectrometry
(GC-MS), Materials Engineering, Inc. can identify the constituents
present in surface contaminants, filtrates, sludges or residues, even
if only a minute quantity is available. Our EDS can detect all elements
down to boron, atomic number 5, and our GC-MS and Micro-FTIR can evaluate
all organic species, allowing us to identify virtually any contaminant.  Learn
more about SEM/EDS in the 2001 MEi newsletter. |
Identification
of • Contaminants • Residues •
Corrosion Products • Sludges • Filtrates •
Filters and Patches • Wear Debris • Oil/Grease
Films • Foreign Particles
• Surface Spots or Discoloration
• Odors or Smells
• Residual Solvents
• Residual Monomers
• Phthalate Plasticizers
• Bisphenol A, or BPA
Common
Applications • Plating and Metal Finishing •
Electronics • Medical Products • Chemical Processing
• Brazing and Soldering • Castings • Bearings
and Wear Components
• Cleanliness Critical Processing
• Plastic Components
• Molded Parts |
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Once the
contaminant has been identified, its source can be tracked down. Common
sources of contamination are corrosion, wear and external or foreign
objects. Once the source is determined, the problem can be eliminated. |
 Next:
Polymer Analysis |
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